JEOL JSM-5600LV type electron microscope

  • The JEOL JSM-5600LV type electron microscope was put into operation in 1998.
  • This microscope is used for observation of samples in a broad magnification range up to 300 000. The special LV (low vacuum) mode allows nonconductive specimens, (especially biological samples) to be observed in their native state.
  • The images can be stored on conventional photographic film or in digital form.
  • The elemental analysis of the specimen is also possible using the attached energy dispersive X-ray spectrometer (EDS) and an X-ray fluorescence (XRF) unit.
  • The electron microscope is operated at the Department of Radiation Chemistry